The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 2012

Filed:

Dec. 21, 2011
Applicants:

Konstantinos Sarrigeorgidis, Sunnyvale, CA (US);

Yanni Chen, Sunnyvale, CA (US);

Leilei Song, Sunnyvale, CA (US);

Kedar Shirali, San Jose, CA (US);

Inventors:

Konstantinos Sarrigeorgidis, Sunnyvale, CA (US);

Yanni Chen, Sunnyvale, CA (US);

Leilei Song, Sunnyvale, CA (US);

Kedar Shirali, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 27/06 (2006.01); H03M 13/03 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and apparatus are provided for computing reliability values in a pipeline. A reliability value portion is computed, with control circuitry in a first pipeline stage, based on a difference between a received input signal value and an expected value. The reliability value portion is combined, in a second pipeline stage that follows the first pipeline stage, with a first value derived from the received input signal to generate a first reliability value. A determination is made as to whether to update the first reliability value in a third pipeline stage based on a combination of the first reliability value with a second reliability value that corresponds to a second value derived from the received input signal.


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