The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2012
Filed:
Sep. 30, 2008
LU Yuan, Carlsbad, CA (US);
Danlu Zhang, San Diego, CA (US);
Mehraban Iraninejad, Del Mar, CA (US);
Sharad Sambhwani, San Diego, CA (US);
Lu Yuan, Carlsbad, CA (US);
Danlu Zhang, San Diego, CA (US);
Mehraban Iraninejad, Del Mar, CA (US);
Sharad Sambhwani, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
Techniques for estimating thermal noise and rise-over-thermal (RoT) in a communication system are described. Thermal noise in a sideband may be measured and used as an estimate of thermal noise in a signal band. In one design, samples containing a desired signal centered at DC or a frequency higher than DC may be partitioned into blocks of K samples. Each block of K samples may be transformed with an FFT to obtain a corresponding block of K transform coefficients for K frequency bins. The power of transform coefficients for frequency bins in the sideband may be computed. Thermal noise may be estimated based on power values for the frequency bins in the sideband. Power values for frequency bins in the signal band may also be obtained and used to estimate total received power. RoT may then be estimated based on the estimated thermal noise and the estimated total received power.