The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2012
Filed:
Nov. 30, 2007
Rick Sayre, Kensington, CA (US);
Rod Bogart, San Rafael, CA (US);
Rick Sayre, Kensington, CA (US);
Rod Bogart, San Rafael, CA (US);
Pixar, Emeryville, CA (US);
Abstract
Test patterns and associated techniques for testing the fidelity of intensity reproduction are disclosed. One set of embodiments provide test patterns that incorporate anti-aliased features such as anti-aliased edges or lines. In various embodiments, these anti-aliased features expose undesirable, nonlinear transformations of the test patterns by one or more devices in an image output system or chain. Using these test patterns, users may more easily evaluate the end-to-end gamma response of the system, and may more easily calibrate gamma controls accordingly. Additionally, users may more easily identify nonlinear image resampling performed in gamma, rather than linear, space.