The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2012
Filed:
Aug. 19, 2009
BO Sung Ku, Gyunggi-do, KR;
Tae Yoon Kim, Seoul, KR;
Young-ho Cho, Daejeon, KR;
Young Soo OH, Gyunggi-do, KR;
Sung Koo Kang, Gyunggi-do, KR;
Sang Jin Kim, Gyunggi-do, KR;
Bo Sung Ku, Gyunggi-do, KR;
Tae Yoon Kim, Seoul, KR;
Young-Ho Cho, Daejeon, KR;
Young Soo Oh, Gyunggi-do, KR;
Sung Koo Kang, Gyunggi-do, KR;
Sang Jin Kim, Gyunggi-do, KR;
Samsung Electro-Mechanics Co., Ltd., Suwon, Gyunggi-Do, KR;
Abstract
According to a device and system for measuring the properties of cells, there is an advantage in that, since a cell accommodation unit having a volume is provided, the properties of three-dimensional cells can be measured. Further, the present invention is advantageous in that it enables passive measurement of multiple properties which passively measures the electrical, mechanical and/or optical properties of cells, and active measurement of multiple properties which actively applies electrical, mechanical and optical types of stimulation to cells and measures their electrical, mechanical and/or optical reactions, thus measuring the multiple properties of cells with high reliability.