The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2012
Filed:
Aug. 09, 2007
Applicant:
Hilmar Gugel, Dossenheim, DE;
Inventor:
Hilmar Gugel, Dossenheim, DE;
Assignee:
Leica Microsystems CMS GmbH, Wetzlar, DE;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and an apparatus are suggested for high-resolution optical scanning, particularly in a laser scanning fluorescence microscope. A sample to be scanned comprises a first and a second substance that are switchable into a first and second energy state. In the scanning process, excitation, de-excitation and detection for the first substance is carried out at a different point in time than for the second substance. This achieves a high spatial resolution beyond the diffraction limit while at the same time a high level of information is provided with physically simple and economical means.