The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 2012

Filed:

Feb. 23, 2009
Applicants:

Ingo Kaneblei, Herrnburg, DE;

Thomas Wuske, Malente, DE;

Rainer Polzius, Lübeck, DE;

Björn Lange, Teschow, DE;

Inventors:

Ingo Kaneblei, Herrnburg, DE;

Thomas Wuske, Malente, DE;

Rainer Polzius, Lübeck, DE;

Björn Lange, Teschow, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Tempering of sample () in test strip () is carried out by temperature regulating unit () and heating/cooling unit (). The sample is fed to the test strip by a developer fluid () and a metering unit (). The result of the detection reaction becomes visible by a change in color (), which is detected optically and analyzed. The data of a control chart () with the measured values of first and second temperature sensors () are used to set the control parameters for tempering. Code () on the test sample holder () is read in a sequence of steps. Parameters for phases of the measurement are determined from measured values of first and second temperature sensors, values of the control chart and the code of the test sample holder. These parameters are used by the temperature regulating unit during the measurement.


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