The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2012
Filed:
Feb. 01, 2011
Yasunori Ueno, Tokyo, JP;
Kenichi Takahashi, Tokyo, JP;
Norikazu Hamanaka, Tokyo, JP;
Right Mfg. Co., Ltd., Tokyo, JP;
Abstract
An eye examination apparatus includes an accommodation power acquisition unit, a corrected accommodation power calculation unit, a drive unit and an accommodative microfluctuation measurement unit. The accommodation power acquisition unit acquires an accommodation power which is determined from a difference between a near point and a distant point of an examined eye. The corrected accommodation power calculation unit calculates an integrated value of the accommodation power and a correction coefficient. The drive unit drives a vision target in a direction of an optical axis of the examined eye. The accommodative microfluctuation measurement unit controls the drive unit to cause the vision target to be arranged onto a corrected accommodation position corresponding to the integrated value, such that the accommodative microfluctuation measurement unit measures an eye accommodation function based on a frequency of appearance of a high frequency component representative of ciliary body accommodative microfluctuation.