The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2012
Filed:
Dec. 07, 2010
Seiji Izuo, Nagano-ken, JP;
Seiji Izuo, Nagano-ken, JP;
Seiko Epson Corporation, Tokyo, JP;
Abstract
Provided is a dot omission inspection method used in a printing apparatus for forming an image constituted by dots of first and second photo-durable inks. In the dot omission inspection method, an arbitrary image is formed by performing liquid droplet discharge of causing a liquid droplet of the first or second ink to be landed on a medium, performing provisional curing of irradiating the landed liquid droplet using light from a first light source so as to be provisionally cured, and performing main curing of irradiating the provisionally cured liquid droplet using light from a second light source to fix the liquid droplet on the medium. An inspection image is formed without performing the provisional curing on the liquid droplet of the first ink landed on the medium by performing the liquid droplet discharge, and by causing the liquid droplet of the second ink to be landed by performing the liquid droplet discharge at the same position as the liquid droplet of the first ink which is not provisionally cured so as to mix the first ink and the second ink with each other.