The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2012
Filed:
Dec. 23, 2003
Frank Mcgrath, Wellesley, MA (US);
Mark Metheny, Shirley, MA (US);
Kenneth Sandler, Billerica, MA (US);
William C. Tobin, Chelmsford, MA (US);
Frank McGrath, Wellesley, MA (US);
Mark Metheny, Shirley, MA (US);
Kenneth Sandler, Billerica, MA (US);
William C. Tobin, Chelmsford, MA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method, system and apparatus for locating a testable object in a functional testing tool is provided. The method can include comparing object properties for a mapped testable object to object properties for each of a set of candidate testable objects organized in a hierarchy, computing an anchor object in the hierarchy, and determining a best matching candidate testable object for the mapped testable object without requiring an exact match of the object properties while constraining the comparing and determining steps with respect to the anchor object.