The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 04, 2012

Filed:

Jun. 02, 2010
Applicant:

Kyoji Takeichi, Aichi, JP;

Inventor:

Kyoji Takeichi, Aichi, JP;

Assignee:

Nidek Co., Ltd., Aichi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01); B24B 49/00 (2012.01);
U.S. Cl.
CPC ...
Abstract

An eyeglass lens processing apparatus comprising a processing control unit which performs polishing by controlling a lens rotating unit, a grindstone rotating unit and an axis-to-axis distance varying unit based on an input target lens shape so as to process a periphery of a lens, which has been finished, by a lens margin allowed for polishing by the polishing grindstone. The processing control unit controls the lens rotating unit, the grindstone rotating unit and the axis-to-axis distance varying unit based on a lens rotating speed Vand the grindstone rotating speed Vw at least at the final rotation of the lens. The lens rotation speed Vand the grindstone rotation speed Vw satisfy a condition in which an average interval between cyclic stripes appearing on a processed surface of the lens due to height fluctuations of the polishing grindstone is smaller than eye's resolution or is larger than 2 mm.


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