The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 04, 2012

Filed:

Nov. 30, 2010
Applicants:

Brian J. Scannell, Cambridge, MA (US);

Kenric P. Nelson, Hollis, NH (US);

Nora T. Tgavalekos, Tewksbury, MA (US);

Ethan Phelps, Arlington, MA (US);

Inventors:

Brian J. Scannell, Cambridge, MA (US);

Kenric P. Nelson, Hollis, NH (US);

Nora T. Tgavalekos, Tewksbury, MA (US);

Ethan Phelps, Arlington, MA (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The technology described herein includes a system and/or a method for identifying an object. The technology includes determining an alpha parameter that is associated with a fusion function. The technology includes determining a beta parameter that is associated with a degree of expected independence of a received set of data and the received set of data including information associated with a classification of the object. The technology includes fusing the received set of data based on the alpha parameter and the beta parameter. The technology includes generating a probability of identification of the classification of the object based on the fused data.


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