The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2012
Filed:
Aug. 08, 2011
Applicants:
Philipp Lang, Lexington, MA (US);
Daniel Steines, Lexington, MA (US);
Siau-way Liew, Pinole, CA (US);
Rene Vargas-voracek, Sunnyvale, CA (US);
Inventors:
Philipp Lang, Lexington, MA (US);
Daniel Steines, Lexington, MA (US);
Siau-Way Liew, Pinole, CA (US);
Rene Vargas-Voracek, Sunnyvale, CA (US);
Assignee:
ImaTx, Inc., Burlington, MA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention relates to methods and devices for analyzing x-ray images. In particular, devices, methods and algorithms are provided that allow for the accurate and reliable evaluation of bone structure and macro-anatomical parameters from x-ray images.