The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2012
Filed:
Aug. 15, 2008
Yingzi Du, Indianapolis, IN (US);
Craig S. Belcher, Indianapolis, IN (US);
Yingzi Du, Indianapolis, IN (US);
Craig S. Belcher, Indianapolis, IN (US);
Indiana University Research and Technology Corp., Indianapolis, IN (US);
Abstract
An image quality measuring method enables a biometric image to be evaluated to determine whether the biometric image data are adequate for identification processing. The method includes converting a biometric image to dimensionless image data, filtering the dimensionless image data with a band pass filter, identifying a plurality of portions in the filtered data as containing identification features, each portion in the plurality having an information measurement that indicates feature content greater than portions in the filtered data that are excluded from the plurality, and measuring clarity for the biometric image from the identified plurality of portions in the filtered data.