The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2012
Filed:
Oct. 01, 2010
Chin H. Toh, Orange, CA (US);
Chin H. Toh, Orange, CA (US);
The Boeing Company, Chicago, IL (US);
Abstract
Presented is a system and method for dynamically adjusting X-ray power levels to achieve consistent image quality. The method comprises estimating power and photon density based on current process parameters, comparing those estimates with reference values associated with desirable image quality, adjusting the X-ray power level in response to the operation of comparing, and then performing the operations of estimating, comparing, and adjusting so that the estimates approach the reference values. In embodiments, the estimating, comparing, and adjusting operations are performed dynamically as process parameters, such as X-ray spot size and distance to the target, dynamically change. The system comprises a database for storing the reference values and a processor for estimating the photon and power density based on current process parameters, comparing the reference values with the estimates, and outputting a signal to adjust one of the current process parameters such as X-ray power level.