The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2012
Filed:
Sep. 24, 2010
Holger Kunze, Bubenreuth, DE;
Holger Scherl, Erlangen, DE;
Holger Kunze, Bubenreuth, DE;
Holger Scherl, Erlangen, DE;
Siemens Aktiengesellschaft, München, DE;
Abstract
A method for determining absorption coefficients corrected with polychromy artifacts for an object composed of a plurality of material types differentiated with absorption attributes is provided. A plurality of x-ray beam projections of the object are recorded with monochrome x-rays from different positions. The recorded projections are reconstructed to determine a first set of absorption coefficients. The projections are calculated by reprojection. The recorded projections are corrected by the calculated projections. A second set of absorption coefficients corrected with polychromy artifacts is finally determined by reconstructing the corrected projections. A formula-based description of a rule taking account of polychromy is used in the calculation. The rule includes parameters to be determined by the reprojection in the course of the calculation of projections. The method combines steps of conventional methods and is thus more efficient.