The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 04, 2012

Filed:

Apr. 28, 2008
Applicants:

Yohei Hasegawa, Tokyo, JP;

Masahiro Jibiki, Tokyo, JP;

Inventors:

Yohei Hasegawa, Tokyo, JP;

Masahiro Jibiki, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 12/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A topology specifying apparatusaccording to this invention includes, in a network having a tree type network topology, a route overlap determining sectionconfigured to determine existence or non-existence of an overlap between a first route to a terminal having an unknown connection node and a second route between terminals having known connection nodes; and a topology specifying sectionconfigured to determine a network topology based on the existence or non-existence of the overlap of the first route and the second route.


Find Patent Forward Citations

Hasegawa, Yohei. (2012). Topology specifying method and topology specifying apparatus (U.S. Patent No. 8259619). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8259619

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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