The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2012
Filed:
Nov. 18, 2009
David James Harra, Scotts Valley, CA (US);
Rick Eugene Sanner, Sun Valley, NV (US);
Mark Norman Iverson, Reno, NV (US);
David James Harra, Scotts Valley, CA (US);
Rick Eugene Sanner, Sun Valley, NV (US);
Mark Norman Iverson, Reno, NV (US);
RF Science & Technology Inc., Reno, NV (US);
Abstract
Systems and methods for scanning and analyzing characteristics of a gas sample utilizing electromagnetic radiation are disclosed. More particularly, the systems and methods utilize an electromagnetic radiation source connected to a transmitter and an analyzer connected to a receiver. A sample gas volume to be analyzed is placed between the transmitter and receiver and a frequency sweep of electromagnetic radiation is transmitted through the sample to create a series of spectral data sets, which are developed into a composite spectrogram by the analyzer and processed to determine the one or more characteristics of the sample. A magnetic field can alternatively be applied around the transmitter, receiver and sample to enhance some characteristic analysis applications and to make other characteristic analysis applications possible.