The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2012
Filed:
Mar. 02, 2009
Applicant:
Tae-hee Kim, Suwon-si, KR;
Inventor:
Tae-hee Kim, Suwon-si, KR;
Assignee:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 17/02 (2006.01); H04N 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
An image quality assessment method and an image quality assessment apparatus are provided. In the image quality assessment method, the contrast of a measurement pattern displayed on the display apparatus, the brightness of the background, and the resolution are adjusted, and thereby the luminance characteristic of the measurement pattern is detected. Accordingly, the image quality of a display apparatus can be assessed using the number of waves determined from the luminance characteristic and the modulation transfer function (MTF) of the waves. Therefore, image quality assessment can be performed objectively by the display apparatus.