The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2012
Filed:
Nov. 30, 2009
Tomohiro Uchida, Tokyo, JP;
Tomohiro Uchida, Tokyo, JP;
Olympus Corporation, Tokyo, JP;
Abstract
An imaging system for a microscope comprises: an imaging unit imaging an optical image from a microscope; a display unit displaying the imaged image; a specifying unit specifying at least a given position on the displayed image to set a measurement target; a measurement and drawing unit performing measurement of the measurement target and drawing of the measurement target, as well as making a measurement value obtained by the measurement displayed at a predetermined position on the screen; a magnification change determination unit determining whether there has been a change in an observation magnification of the microscope; a control unit performing, when it is determined that there has been a change in the observation magnification of the microscope after the measurement value is displayed, an output in accordance with the change.