The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 04, 2012

Filed:

Sep. 09, 2008
Applicants:

Hiroshi Ishiwata, Hachioji, JP;

Hiroyuki Nishida, Sagamihara, JP;

Keiji Handa, Hachioji, JP;

Kenji Harano, Hachioji, JP;

Daisuke Asada, Hachioji, JP;

Inventors:

Hiroshi Ishiwata, Hachioji, JP;

Hiroyuki Nishida, Sagamihara, JP;

Keiji Handa, Hachioji, JP;

Kenji Harano, Hachioji, JP;

Daisuke Asada, Hachioji, JP;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A62B 1/04 (2006.01); A61B 1/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A scattering medium internal observation apparatus according to the present invention includes: a light source; an illuminating apparatus that guides light from the light source to an observation object that is a scattering body; and an observation optical system for observing the observation object illuminated by the illuminating apparatus, wherein the illuminating apparatus has a light-guiding member that guides light from the light source to a surface of the observation object, and a light-shielding member that covers the surface of the observation object and which shields light reflected or scattered in the vicinity of the light-guiding member of the observation object is disposed in the vicinity of an end portion of the light-guiding member on an observation object-side.


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