The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 04, 2012

Filed:

Oct. 22, 2007
Applicants:

Jae-gyun Shim, Suwon-si, KR;

Yun-sung NA, Cheunan-si, KR;

In-gu Jeon, Suwon-si, KR;

Tae-hung Ku, Suwon-si, KR;

Jung-woo Hwang, Hwaseong-si, KR;

Inventors:

Jae-Gyun Shim, Suwon-si, KR;

Yun-Sung Na, Cheunan-si, KR;

In-Gu Jeon, Suwon-si, KR;

Tae-Hung Ku, Suwon-si, KR;

Jung-Woo Hwang, Hwaseong-si, KR;

Assignee:

TechWing., Co. Ltd, Hwaseung-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test tray for a test handler is disclosed that is loaded with semiconductor devices and then carries them along a predetermined circulation route. The test tray allows one fixing unit to fix a plurality of adjacent insert modules to the receiving spaces of the frame, thereby efficiently using the space of the frame and allowing a relatively large number of insert modules to be installed in the same area, in comparison to the conventional test tray.


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