The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 04, 2012

Filed:

Dec. 17, 2007
Applicants:

Satoshi Hirata, Kodaira, JP;

Yoshitaka Bito, Kokubunji, JP;

Kiyoharu Tanaka, Iruma, JP;

Inventors:

Satoshi Hirata, Kodaira, JP;

Yoshitaka Bito, Kokubunji, JP;

Kiyoharu Tanaka, Iruma, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An object of the invention is to obtain a magnetic resonance spectroscopic image to which the MAC summation is applied with high accuracy and in short time, even though a phase characteristic distribution of the MAC has a spatial non-uniformity, in the MRSI measurement using a magnetic resonance imaging apparatus provided with a MAC. Using a non-water-suppressed image signal with high SNR, obtained in the non-water-suppressed measurement (a reference measurement) without water suppression, a correction value for correcting the phase distortion for the MAC summation is calculated on each pixel in each coil. After correcting a phase on each pixel in each coil of a main-scan image signal measured under suppressing water (water-suppressed image signal) using the corrective value, signal adding operation (summation) is performed. Then, a phase correction in a spectrum-axis is to be performed on the summed spectrum signal.


Find Patent Forward Citations

Loading…