The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 04, 2012

Filed:

Oct. 31, 2008
Applicants:

Donald E. Yuhas, Glen Ellyn, IL (US);

Don G. Walker, Jr., Nashville, TN (US);

Mark J. Mutton, DeKalb, IL (US);

Inventors:

Donald E. Yuhas, Glen Ellyn, IL (US);

Don G. Walker, Jr., Nashville, TN (US);

Mark J. Mutton, DeKalb, IL (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and apparatus for measuring heat flux in a material are disclosed. A disclosed example method involves emitting an acoustic signal into the material and determining a first propagation time associated with the propagation of the acoustic signal through the material. A first heat flux value indicative of a first heat flux of the material is then determined based on the first propagation time.


Find Patent Forward Citations

Yuhas, Donald. (2012). Methods and apparatus for measuring temperature and heat flux in a material using ultrasound (U.S. Patent No. 8256953). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8256953

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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