The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2012
Filed:
May. 14, 2009
Yijun Huang, Pleasantville, NY (US);
Tetsuyoshi Royama, Montvale, NJ (US);
Alexandre Kotchkin, Ridgewood, NJ (US);
Yijun Huang, Pleasantville, NY (US);
Tetsuyoshi Royama, Montvale, NJ (US);
Alexandre Kotchkin, Ridgewood, NJ (US);
Topcon Medical Systems, Inc., Oakland, NJ (US);
Abstract
Certain diseases of the retina are diagnosed by circular profile analysis of retinal parameters, such as thickness. Retinal thickness around a user-defined circle on the retina is measured by various ophthalmological techniques and—+mapped to a circular profile map. The circular profile map does not use segmentation of measurement data into arbitrary arcs, and thickness is mapped to a quasi-continuous range of display bands. The circular profile map is superimposed on a fundus image, or other two-dimensional image of the retina, allowing association of the circular profile map with the presence of blood vessels and other anatomical features. The simultaneous display of a series of circular profile maps generated from sets of measurement data taken at different times permits the ready visualization of the progression of retinal abnormalities.