The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 04, 2012

Filed:

Oct. 24, 2008
Applicants:

Russell R. Graze, Jr., Dunlap, IL (US);

Linda M. Riedlinger, Creve Coeur, IL (US);

Jerry K. Randall, East Peoria, IL (US);

Inventors:

Russell R. Graze, Jr., Dunlap, IL (US);

Linda M. Riedlinger, Creve Coeur, IL (US);

Jerry K. Randall, East Peoria, IL (US);

Assignee:

Caterpillar Inc., Peoria, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 1/22 (2006.01);
U.S. Cl.
CPC ...
Abstract

Testing of engine particulate matter production during a transient is made more accurate by selecting an appropriate sized opening for a test probe of the sampling system located in the exhaust line upstream from a particulate trap. By examining the pressure signature at the test probe location and utilizing that information in conjunction with a desired volumetric flow rate into the sampling system, a flow opening size for the test probe can be selected that reduces potential oversampling which may be otherwise induced due to the back pressure increases in the exhaust line caused by the presence of the particulate trap. The flow opening into the test probe of the sampling system behaves relative unrestricted when pressure differentials at the test probe location are relatively low, such as during steady state operating conditions, but restricts flow into the sampling system when pressure differentials are relatively high, such as at a pressure during a transient event.


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