The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2012
Filed:
Oct. 31, 2008
Dirk Manfred Beyer, Walnut Creek, CA (US);
Phillip Dennis Delurgio, Foster City, CA (US);
James Frederic Drew, Redwood City, CA (US);
Nathaniel Keith Folkert, Brooklyn, NY (US);
Steven John Peter Hillion, San Francisco, CA (US);
Michael Alexander Shwe, San Francisco, CA (US);
Chad William Whipkey, Foster City, CA (US);
Dirk Manfred Beyer, Walnut Creek, CA (US);
Phillip Dennis Delurgio, Foster City, CA (US);
James Frederic Drew, Redwood City, CA (US);
Nathaniel Keith Folkert, Brooklyn, NY (US);
Steven John Peter Hillion, San Francisco, CA (US);
Michael Alexander Shwe, San Francisco, CA (US);
Chad William Whipkey, Foster City, CA (US);
DemandTec, Inc., San Mateo, CA (US);
Abstract
Methods and apparatuses for computing a variance between two business metrics is described. In one embodiment, the method computes a variance for each of a first set of activities based on the corresponding reference state of that activity, wherein the variance for an activity is the change in contribution for that activity between the first and second business metrics and with each of the first set of activities having a reference value. Furthermore, the method computes a variance for each of a second set of activities based on the corresponding start and end values of that activity with each of the second set of activities having a start and end value.