The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2012
Filed:
Jun. 30, 2009
Paul J. Husted, San Jose, CA (US);
Soner Ozgur, Santa Clara, CA (US);
Paul J. Husted, San Jose, CA (US);
Soner Ozgur, Santa Clara, CA (US);
QUALCOMM Atheros, Inc, San Jose, CA (US);
Abstract
Various devices and techniques for testing an analog portion of communication devices are disclosed. Such devices may include a communication unit and an analog test unit. The analog test unit may be configured to test analog portions of the communication unit and communicate information regarding testing to an external test unit. The analog test unit may also be configured to perform an analysis of a test signal that is output by a transmitter portion, looped back to a receiver portion, and subsequently received by the analog test unit. The analog test unit may also be configured to calibrate a DC offset of a receiver chain of the communication unit. The analog test unit may also be configured to perform a nonlinearity test on one or more ADCs and/or DACs of the communication unit.