The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2012

Filed:

Nov. 18, 2008
Applicants:

Takehiro Tsuritani, Saitama, JP;

Jun Haeng Lee, Saitama, JP;

Tomohiro Otani, Saitama, JP;

Inventors:

Takehiro Tsuritani, Saitama, JP;

Jun Haeng Lee, Saitama, JP;

Tomohiro Otani, Saitama, JP;

Assignee:

KDDI Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/08 (2006.01); H04B 10/12 (2006.01); G02B 26/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to the quality monitoring of optical signals, which have different symbol rates and generated by different modulation schemes, used for example in a wavelength division multiplexing network. The apparatus according to the invention includes an optical splitter for outputting the input optical signal to a first optical route and a second optical route, an optical coupler for coupling a optical signal from the first optical route with a optical signal from the second optical route, a delay unit provided on the first optical route, and a phase shift unit provided on the first optical route or the second optical route.


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