The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2012

Filed:

Nov. 06, 2008
Applicant:

Lloyd G. Allred, Rochester, NY (US);

Inventor:

Lloyd G. Allred, Rochester, NY (US);

Assignee:

Bausch & Lomb Incorporated, Rochester, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/36 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for determining a centroid coordinate of an image spot, comprising a) determining a search region having a border, b) identifying a first pixel in the search region, the pixel having a first intensity value, c) determining an upper threshold intensity value greater than the first intensity value, d) searching for a second pixel within the search region having an intensity value that is greater than the upper threshold intensity value, and e) upon finding the second pixel, designating the first pixel an integration region center.


Find Patent Forward Citations

Allred, Lloyd. (2012). Method and apparatus for making and processing aberration measurements (U.S. Patent No. 8254724). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8254724

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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