The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2012

Filed:

Feb. 02, 2009
Applicants:

Michael Isard, San Francisco, CA (US);

Qifa KE, Cupertino, CA (US);

Jian Sun, Beijing, CN;

Zhong Wu, Beijing, CN;

Inventors:

Michael Isard, San Francisco, CA (US);

Qifa Ke, Cupertino, CA (US);

Jian Sun, Beijing, CN;

Zhong Wu, Beijing, CN;

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06K 9/54 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods are disclosed for finding images from a large corpus of images that at least partially match a query image. The present method makes use of feature detectors to bundle features into local groups or bundles. These bundled features are repeatable and much more discriminative than an individual SIFT feature. Equally importantly, the bundled features provide a flexible representation that allows simple and robust geometric constraints to be efficiently enforced when querying the index.


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