The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2012
Filed:
Jun. 08, 2009
Xing LI, Webster, NY (US);
Ryan Metcalfe, Marion, NY (US);
Peter Mccandlish, Rochester, NY (US);
Barbara Farrell, Ontario, NY (US);
Xing Li, Webster, NY (US);
Ryan Metcalfe, Marion, NY (US);
Peter McCandlish, Rochester, NY (US);
Barbara Farrell, Ontario, NY (US);
Xerox Corporation, Norwalk, CT (US);
Abstract
Disclosed herein is a method for detecting thin lines in image data. The method is performed by a processor to process contone image data. The processing includes thresholding a window of pixels established in the contone domain to generate a binary window of image data, and then determining characteristics associated with on pixels or runs of the binary data. The characteristics (start and end locations, length of on runs) are then thresholded. The processing in the contone and binary domain are used to determine if a thin line exists in the window of image data. The disclosed method produces better quality output images and reduces the addition of false lines in an image.