The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2012

Filed:

Oct. 13, 2009
Applicants:

Eugene Alex Ingerman, San Francisco, CA (US);

Samit Basu, Fremont, CA (US);

Jed Pack, Glenville, NY (US);

Todd Gable, Newark, CA (US);

Inventors:

Eugene Alex Ingerman, San Francisco, CA (US);

Samit Basu, Fremont, CA (US);

Jed Pack, Glenville, NY (US);

Todd Gable, Newark, CA (US);

Assignee:

Morpho Detection, Inc., Newark, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01N 23/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for selective resolution improvement in computed tomography (CT) scanning. The method includes receiving scan data representative of a scanned object from a CT scanner and reconstructing the scan data using a first algorithm to create a first set of reconstructed data. A region of interest is identified within the first set of reconstructed data. A portion of the scan data corresponding to the region of interest is reconstructed using a second algorithm to create a second set of reconstructed data. The first set of reconstructed data and the second set of reconstructed data are combined to create combined reconstructed data.


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