The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2012

Filed:

Oct. 23, 2009
Applicants:

Brandon T. Hunt, Seattle, WA (US);

Ernst S. Henle, Issaquah, WA (US);

Andrey Bondarenko, Bellevue, WA (US);

Inventors:

Brandon T. Hunt, Seattle, WA (US);

Ernst S. Henle, Issaquah, WA (US);

Andrey Bondarenko, Bellevue, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01N 33/53 (2006.01);
U.S. Cl.
CPC ...
Abstract

After prepared biological samples have been submitted to liquid-chromatography/mass spectrometry equipment, digital images are produced that show variations. Some of these variations may be of interest while others are not of interest. Variations in regions of interest can be correlated and correlation scores produced to classify biological features aid in scientific discovery. Shape properties of variations can also be calculated by geometric scores. A microalignment method aids the correlation calculation without resorting to macroalignment.


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