The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2012

Filed:

Jul. 22, 2010
Applicant:

Koji Takekoshi, Yokohama, JP;

Inventor:

Koji Takekoshi, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05G 1/64 (2006.01);
U.S. Cl.
CPC ...
Abstract

An imaging apparatus having an X-ray detector and an image display unit comprises first and second display magnification calculation units and a selection unit. The first display magnification calculation unit receives information of the detected image size, a binning condition and a display frame size, and thereby calculating a first display magnification so as to maximize a display area of the detected image. The second display magnification calculation unit temporarily changes the received binning condition, and by using the temporarily changed binning condition and the received detected image size, and calculates a second display magnification so as to maximize a display area. The selection unit selects the first display magnifications and the temporarily change binning condition if the first display magnification is closer to one and the second display magnification with one.


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