The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2012
Filed:
Apr. 21, 2008
Charles E. Wheatley, Iii, Del Mar, CA (US);
Avneesh Agrawal, San Diego, CA (US);
Danlu Zhang, San Diego, CA (US);
Sharad Deepak Sambhwani, San Diego, CA (US);
LU Yuan, Carlsbad, CA (US);
Mehraban Iraninejad, Del Mar, CA (US);
Charles E. Wheatley, III, Del Mar, CA (US);
Avneesh Agrawal, San Diego, CA (US);
Danlu Zhang, San Diego, CA (US);
Sharad Deepak Sambhwani, San Diego, CA (US);
Lu Yuan, Carlsbad, CA (US);
Mehraban Iraninejad, Del Mar, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
Techniques for estimating thermal noise and rise-over-thermal (RoT) in a communication system are described. In an aspect, thermal noise in a sideband may be measured and used to estimate thermal noise in a signal band. In one design, received power in the sideband may be measured, e.g., by computing total power of FFT transform coefficients within the sideband. Thermal noise may be estimated based on (e.g., by filtering) the measured received power in the sideband. Received power in the signal band may also be measured. Total received power may be estimated based on (e.g., by filtering) the measured received power in the signal band. RoT may then be estimated based on the estimated thermal noise and the estimated total received power. The estimated RoT may be used to estimate an available load for a cell, which may be used to admit and/or schedule users in the cell.