The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2012
Filed:
Dec. 30, 2008
Yimin Hsu, Sunnyvale, CA (US);
Arley Cleveland Marley, San Jose, CA (US);
Yimin Hsu, Sunnyvale, CA (US);
Arley Cleveland Marley, San Jose, CA (US);
Hitachi Global Storage Technologies Netherlands B.V., Amsterdam, NL;
Abstract
A method for determining a magnetic anisotropy of a free layer of a magnetoresistive sensor. The method includes forming a functional magnetoresistive sensor and also a test sensor on a wafer. The test sensor has a sensor stack that is identical to that of the functional sensor, however the test head does not have a magnetic bias structure for biasing the free layer. A series of tests can be performed to construct a transfer curve for the test sensor. This can then be used to determine a magnetic anisotropy of the test head, which also corresponds to a magnetic anisotropy of the functional head.