The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2012
Filed:
Jun. 24, 2009
Hideaki Nishiuchi, Hitachinaka, JP;
Kazuyoshi Saito, Hitachi, JP;
Masahiro Tadokoro, Hitachiohta, JP;
Hiroshi Akiyama, Hitachiohta, JP;
Kazuo Hiramoto, Hitachiohta, JP;
Hideaki Nishiuchi, Hitachinaka, JP;
Kazuyoshi Saito, Hitachi, JP;
Masahiro Tadokoro, Hitachiohta, JP;
Hiroshi Akiyama, Hitachiohta, JP;
Kazuo Hiramoto, Hitachiohta, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A charged particle beam irradiation system includes a synchrotron which accelerates an ion beam, an irradiation apparatus for irradiating an object with the ion beam introduced from the synchrotron, detection means for measuring an amount of accumulated charge of the ion beam that orbits in the synchrotron immediately before an extraction control period in an operating cycle of the synchrotron, and beam extraction control means for controlling extraction of the ion beam based on the measurement result of the accumulated beam charge amount so that extraction of a total amount of the ion beam is to be completed with an expiration of an extraction control time, the extraction control time representing a length of the extraction control period of the synchrotron and being set in advance.