The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8253092 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 28, 2012

Filed:

Jul. 01, 2009
Applicants:

Emmanuelle Vigier-blanc, Le Sappey en Chartreuse, FR;

Guillaume Cassar, Grenoble, FR;

Thierry Lepine, Saint-Heand, FR;

Inventors:

Emmanuelle Vigier-Blanc, Le Sappey en Chartreuse, FR;

Guillaume Cassar, Grenoble, FR;

Thierry Lepine, Saint-Heand, FR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 3/14 (2006.01); H01L 27/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical die, which is intended to be placed in front of an optical sensor of a semiconductor component, has an optically useful zone having an optical axis and exhibiting a variable refractive index. Specifically the refractive index of the die is variable in an annular peripheral zone lying between a radius Ru enveloping the useful zone and a smaller radius Ro. The index varies as a function of radial distance from a lower value near the smaller radius Ro to a higher value near the radius Ru. The function of the variable refractive index lies between a maximum and minimum profile.


Find Patent Forward Citations

Vigier-Blanc, Emmanuelle. (2012). Optical die with variable refractive index, corrective of negative distortion, and method of fabricating such a die (U.S. Patent No. 8253092). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8253092

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