The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2012
Filed:
May. 30, 2009
Kedar Hardikar, San Jose, CA (US);
Todd Krajewski, Mountain View, CA (US);
Kedar Hardikar, San Jose, CA (US);
Todd Krajewski, Mountain View, CA (US);
Mia Sole, Santa Clara, CA (US);
Abstract
Multilayer articles such as thin-film solar cells can be effectively tested under thermal load in a mini-module that includes a chamber or enclosure in which one or more laminated multilayer articles are housed. The inner dimensions of the chamber, at least along the axis that is perpendicular to the plane defined by the laminated solar cells, are configured to remain substantially constant during testing. Cooling the laminated solar cells in the mini-module device causes the encapsulant material to shrink and thereby induces accelerated failures in the laminated solar cells and associated structures. A technique of detecting the presence of defects or failures is near infrared radiation thermography wherein NIR images of the laminated solar cells are taken during the cooling process. The color patterns manifested from the cooled laminated solar cells can reveal the location, nature and extent of the defect or failure.