The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2012

Filed:

Apr. 22, 2008
Applicants:

Satoshi Seki, Kawasaki, JP;

Hiroshi Tajika, Yokohama, JP;

Hitoshi Nishikori, Inagi, JP;

Takeshi Yazawa, Yokohama, JP;

Fumiko Yano, Tokyo, JP;

Jun Yasutani, Kawasaki, JP;

Atsushi Takahashi, Kawasaki, JP;

Inventors:

Satoshi Seki, Kawasaki, JP;

Hiroshi Tajika, Yokohama, JP;

Hitoshi Nishikori, Inagi, JP;

Takeshi Yazawa, Yokohama, JP;

Fumiko Yano, Tokyo, JP;

Jun Yasutani, Kawasaki, JP;

Atsushi Takahashi, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J 29/38 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention aims to obtain preferable correction values to correct the conveying error of a conveying roller in accordance with the size of a printing medium, even when the conveying error caused by the eccentricity of the roller varies from a point to another in the longitudinal direction of a roller, depending on the amount and the state of eccentricity of the roller. To achieve this object, correction values are acquired using the whole part of or only a part of plural test patterns formed in the longitudinal direction of the roller. The correction values thus acquired correspond to the respective zones where the test patterns are formed.


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