The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2012
Filed:
Feb. 19, 2009
Kazuya Ehara, Hitachiohta, JP;
Naoyuki Kono, Mito, JP;
Masahiro Miki, Tokai, JP;
Yoshio Nonaka, Hitachi, JP;
Kazuya Ehara, Hitachiohta, JP;
Naoyuki Kono, Mito, JP;
Masahiro Miki, Tokai, JP;
Yoshio Nonaka, Hitachi, JP;
Hitachi-GE Nuclear Energy, Ltd., Ibaraki, JP;
Abstract
An ultrasonic inspection method and ultrasonic inspection apparatus is capable of inspecting a weld line and of detecting a circumferential crack and an axial crack that are present in the weld line. An ultrasonic probe is placed on the surface of a structure and transmits an ultrasonic wave. The ultrasonic wave is transmitted at an angle in an X'-Z plane. The direction of a normal to the surface is defined as an X axis. The direction in which the weld line extends is defined as a Y axis. The direction perpendicular to the X axis and the Y axis is defined as a Z axis. An axis obtained by rotating the X axis around the Z axis is defined as an X′ axis. A control mechanism performs signal processing of signals reflected from the defect or defects to detect the defect or defects and to measure the length of the defect or defects.