The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8250427 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 21, 2012

Filed:

Oct. 01, 2008
Applicants:

John Johnson Wylie, San Francisco, CA (US);

Ram Swaminathan, Cupertino, CA (US);

Inventors:

John Johnson Wylie, San Francisco, CA (US);

Ram Swaminathan, Cupertino, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A technique for selecting an erasure code from a plurality of erasure codes for use in a fault tolerant system comprises generating a preferred set of erasure codes based on characteristics of the codes' corresponding Tanner graphs. The fault tolerances of the preferred codes are compared based at least on the Tanner graphs. A more fault tolerant code is selected based on the comparison.


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Wylie, John. (2012). Selecting erasure codes for a fault tolerant system (U.S. Patent No. 8250427). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8250427

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