The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2012
Filed:
Jul. 28, 2009
Nishad S. Prabhu, Wichita, KS (US);
Aniruddha Deo, Wichita, KS (US);
Pravin Kulkarni, Wichita, KS (US);
Gregory Frye, Wichita, KS (US);
Shashikiran Prabhaker Mysur, Wichita, KS (US);
Nishad S. Prabhu, Wichita, KS (US);
Aniruddha Deo, Wichita, KS (US);
Pravin Kulkarni, Wichita, KS (US);
Gregory Frye, Wichita, KS (US);
Shashikiran Prabhaker Mysur, Wichita, KS (US);
Textron Innovations, Inc., Providence, RI (US);
Abstract
A method for determining an optimized structure for skin stretch form blocks. An optimized stretch form block design is generated by performing a finite element analysis on a stretch form block design selected from a target group of the stretch form blocks which have been classified into a plurality of groups based on similar topology of the blocks. The finite element analysis includes specifying a suggested design and generating the optimized stretch form block design by iteratively modifying the suggested design until the suggested design has a predetermined sufficient structural strength. An interpolation model is generated from the optimized stretch form block design, and an optimized stretch form block structure is determined for any stretch form block having size and weight parameters within an envelope defined by the target group of the stretch form blocks, by performing a weighted nearest neighbor interpolation using specified geometric parameters and material parameters.