The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2012
Filed:
Jun. 30, 2009
Stanley P. Haag, Highlands Ranch, CO (US);
Anton A. Bougaev, La Jolla, CA (US);
Aleksey M. Urmanov, San Diego, CA (US);
Steven F. Zwinger, Poway, CA (US);
Kenny C. Gross, San Diego, CA (US);
Stanley P. Haag, Highlands Ranch, CO (US);
Anton A. Bougaev, La Jolla, CA (US);
Aleksey M. Urmanov, San Diego, CA (US);
Steven F. Zwinger, Poway, CA (US);
Kenny C. Gross, San Diego, CA (US);
Oracle America, Inc., Redwood Shores, CA (US);
Abstract
Some embodiments provide a system that analyzes telemetry data from a monitored system. During operation, the system obtains the telemetry data as a set of telemetric signals from the monitored system and groups the telemetry data into one or more clusters of correlated telemetric signals from the telemetric signals. Next, the system increases a bandwidth associated with monitoring the telemetric signals. To increase the bandwidth, the system omits one or more of the correlated telemetric signals from each of the clusters during sampling of the telemetric signals and estimates the omitted correlated telemetric signals by applying a nonlinear, nonparametric regression technique to the sampled telemetric signals.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile