The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2012
Filed:
Jan. 24, 2008
Marie-pierre Denieul, Clichy, FR;
Olivier Daniel, Lognes, FR;
Arnaud Bucaille, Colombes, FR;
Cyrille Lemoine, Sartrouville, FR;
Marie-Pierre Denieul, Clichy, FR;
Olivier Daniel, Lognes, FR;
Arnaud Bucaille, Colombes, FR;
Cyrille Lemoine, Sartrouville, FR;
Veolia Eau—Compagnie Generale des Eaux, Paris, FR;
Abstract
The invention relates to a method of qualifying the variability of the composition of an effluent, in which method a series of measurements is effected over time of at least one first and one second parameter of the effluent. The invention is characterized in that, in each time step, first and second derivatives of the parameters are determined, first and second logical domains are defined, probabilities of the first derivatives belonging to the first logical domains are assigned, probabilities of the second derivatives belonging to the second logical domains are assigned, global logical domains are defined, global probabilities of belonging to the global logical domains are assigned, and the variability of the composition of the effluent is qualified on the basis of these global probabilities of belonging to the global logical domains.