The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2012
Filed:
Mar. 27, 2009
Jae Wook Jeon, Daejeon, KR;
Dong Kyun Kim, Suwon-si, KR;
Seung Hun Jin, Suwon-si, KR;
Ki Hoon Kim, Suwon-si, KR;
Sang Jun Lee, Suwon-si, KR;
Tuong Thuy Nguyen, Suwon-si, KR;
Jae Wook Jeon, Daejeon, KR;
Dong Kyun Kim, Suwon-si, KR;
Seung Hun Jin, Suwon-si, KR;
Ki Hoon Kim, Suwon-si, KR;
Sang Jun Lee, Suwon-si, KR;
Tuong Thuy Nguyen, Suwon-si, KR;
Sungkyunkwan University Foundation for Corporate Collaboration, Cheoncheon-Dong, Jangan-Gu, Suwon-Si, Gyeonggi-Do, KR;
Abstract
Disclosed herein is an image processing method and apparatus for detecting the lines of images and the start and end points of the lines. The image processing apparatus includes an edge creation unit, a Hough transform unit, and an effective parameter detection unit. The edge creation unit creates an edge image using external image data input from the outside. The Hough transform unit performs a Hough transform on information about the pixel coordinates of the edge image created by the edge creation unit. The effective parameter detection unit detects the lines of the edge image by checking effective line parameters using the results of the Hough transform. The image processing apparatus may further include an edge list for storing coordinates of effective pixels constituting the edge image and a line parameter list for storing the effective line parameters.