The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2012
Filed:
Sep. 30, 2009
Gunnar Krüger, Erlangen, DE;
Bénédicte Mortamet, Lausanne, CH;
Gunnar Krüger, Erlangen, DE;
Bénédicte Mortamet, Lausanne, CH;
Siemens Schweiz AG, Zurich, CH;
Abstract
A method for quality control assessment in single time-point in-vivo imaging data related to imaging of objects, includes acquiring an in-vivo image of the object with imaging apparatus, defining a background image corresponding to an imaged air of the in-vivo image, defining an object image corresponding to the in-vivo image from which the background image has been removed, obtaining the background and object images by atlas-based registration, reflecting an intensity distribution of the background image with a histogram, fitting a noise mathematical model to part of the histogram intensity distribution, deriving background quality characteristics from the noise mathematical model, reflecting an intensity distribution of the object image with a further histogram, fitting a signal mathematical model to the further histogram intensity distribution, deriving object quality characteristics from the signal mathematical model, and automatically deriving signal-to-noise and contrast-to-noise ratios of in-vivo imaging data from the object quality and background quality characteristics.