The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2012
Filed:
Sep. 10, 2009
Chih-kuang Chang, Taipei Hsien, TW;
Xin-yuan Wu, Shenzhen, CN;
Shao-qin Xie, Shenzhen, CN;
Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Shenzhen, Guangdong Province, CN;
Hon Hai Precision Industry Co., Ltd., Tu-Cheng, New Taipei, TW;
Abstract
A detecting method for measuring gaps between two parts of an object is provided. The detecting method selects a reference image and a measured image, merges the reference image and the measured image to form an image of the object, grids the reference image and the measured image to obtain triangle mesh surfaces, obtains boundary points and outline points of the measured image, and obtains triangles on a joint portion of the reference image and measured points on a corresponding joint portion of the measured image. The method further compares each measured point with an obtained triangle to obtain gap values of the joint portion between the reference image and the measured image, and outputs an analysis report of the gap values on a display device.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile