The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 2012

Filed:

Feb. 29, 2008
Applicants:

Jurgen Hissen, Port Moody, CA;

Dragos Cartina, Burnaby, CA;

Inventors:

Jurgen Hissen, Port Moody, CA;

Dragos Cartina, Burnaby, CA;

Assignee:

PMC-Sierra, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 7/02 (2006.01); H03D 3/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and apparatus are disclosed, such as those involving clock and data recovery sampler calibration. One such method includes receiving an electronic data stream by a clock and data recovery (CDR) circuit comprising a data sampler and an edge sampler. The data stream includes data portions and transitioning portions. The method further includes conducting calibration of the CDR circuit. The calibration includes acquiring samples from the transitioning portions of the data stream using the data sampler; and calibrating the data sampler based at least partially on the samples acquired using the data sampler. The method allows one not only to improve performance, but also to improve yield and reduce testing and screening requirements without requiring any additional circuitry to detect the offsets and works with regular input signals.


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