The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2012
Filed:
Oct. 18, 2010
Erhard Schreck, San Jose, CA (US);
Xuhui Jin, San Jose, CA (US);
Tobias Maletzky, Milpitas, CA (US);
Joe Smyth, Aptos, CA (US);
Dayu Zhou, Fremont, CA (US);
Yuchen Zhou, San Jose, CA (US);
Kenichi Takano, Santa Clara, CA (US);
Erhard Schreck, San Jose, CA (US);
Xuhui Jin, San Jose, CA (US);
Tobias Maletzky, Milpitas, CA (US);
Joe Smyth, Aptos, CA (US);
Dayu Zhou, Fremont, CA (US);
Yuchen Zhou, San Jose, CA (US);
Kenichi Takano, Santa Clara, CA (US);
Headway Technologies, Inc., Milpitas, CA (US);
Abstract
A waveguide structure for aligning a light source to a center waveguide (CWG) in a TAMR head is disclosed and includes two alignment waveguides (AWVG) symmetrically formed about a plane that bisects the CWG lengthwise dimension. Each AWVG has a light coupling section formed parallel to a side of the CWG and captures 0.5% to 10% of the light in the CWG. Each AWVG has an outlet that directs light to a photo detector or camera so that light intensity measurements land lfor first and second AWVG, respectively, can be taken at various positions of the light source. Optimum alignment occurs when (l+l) reaches a maximum value and |l−l| has a minimum value. AWVG outlets may be at the ABS, or at the side or back end of a slider. Measurement sensitivity is increased by decreasing the width of the AWVG.